Acronyms in microscopy

This list is outdated. Technological status of 1997.

Abbreviations

 * AAS 	Atomic Absorption Spectroscopy
 * ACF 	absorption correction factor
 * ADC 	analog to digital converter
 * AED 	Atomic Emission Detector
 * AEM 	analytical electron microscope/microscopy
 * AES 	Atomic Emission Spectroscopy
 * AES 	Auger electron spectroscopy
 * AFM 	atomic force microscopy
 * AFS 	Atomic Fluorescence Spectroscopy
 * APSTM   Analytical Photon Scanning Tunneling Microscope
 * ATW 	atmospheric thin window
 * BSE 	backscattered electron
 * BSED 	backscattered electron diffraction
 * BSEI 	backscattered electron image/imaging
 * CB  	coherent bremsstrahlung
 * CBIM 	convergent-beam imaging
 * CCD 	charge-coupled device
 * CFEG 	cold field-emission gun
 * CL  	condenser lens
 * CL  	cathodoluminescence
 * CRT 	cathode-ray tube
 * CS	counter-scanning
 * CSI	counter-scanned images
 * CTEM 	Conventional Transmission Electron Microscopy
 * DP    Diffraction Pattern
 * DSTEM dedicated scanning transmission electron microscopy
 * EBIC 	electron beam-induced current
 * EBSD 	electron backscatter diffraction
 * ECD 	Electron Capture Detector
 * EDAX 	Energy Dispersive Analysis of X-rays
 * EDS 	Energy Dispersive X-ray Spectroscopy
 * EDX 	Energy Dispersive X-ray Analysis
 * EDXF 	Enery Dispersive X-ray Fluorescence
 * EELS  electron energy-loss spectrometry/spectroscopy
 * EFM   Electro-Force Microscopy
 * EFTEM energy filtering transmission electron microscope
 * EI    Electron Impact
 * EM 	Electron Microscopy
 * EMMA 	electron microscope microanalyzer
 * EMP 	electron microprobe
 * EMPA 	electron microprobe analysis
 * EMS 	electron microscopy image simulation
 * EPASA 	Electron Probe Analysis Society of America
 * EPMA 	electron probe microanalyzer
 * EPMA 	electron probe micro analysis
 * EPMA 	electron probe microanalysis
 * ESCA 	electron spectroscopy for chemical analysis
 * ESD 	Electron Stimulated Desorption
 * ESEM 	Environmental Scanning Electron Microscopy
 * ESI 	electron spectroscopic imaging
 * ESR 	Electron Spin Resonance
 * FA 	Fluorescence Analysis
 * FCF 	fluorescence correction factor
 * FEG 	field emission gun
 * FEM 	Field Emission Electron Microscopy
 * FET 	field effect transistor
 * FFEM 	Freeze-Fracture Electron Microscopy
 * FFT 	fast Fourier transform
 * FIM 	field ion microscopy
 * FOS	feature-oriented scanning
 * FOSPM	feature-oriented scanning probe microscopy
 * FSE 	fast secondary electron
 * FWHM 	full width at half maximum
 * FWTM 	full width at tenth maximum
 * GB 	grain boundary
 * GCS 	generalized cross section
 * HPGe 	high purity Germanium detector
 * HAADF high angle annular darkfield imaging
 * HREM 	high resolution electron microscope
 * HRTEM 	High-resolution transmission electron microscopy
 * HV 	high vacuum
 * HVEM 	high voltage electron microscope/microscopy
 * ICP 	Inductively Coupled Plasma
 * IR 	infrared spectroscopy
 * IVEM 	intermediate voltage electron microscope/microscopy
 * JEOL 	Japanese Electron Optics Laboratory
 * KAP 	potassium acid phthalate
 * LDE1 	Layered Dispertion Element 1
 * LDE2 	Layered Dispertion Element 2
 * LEED 	low-energy electron diffraction
 * LEEM 	Low-energy electron microscopy
 * LIF 	Lithium Fluoride
 * LM 	light microscopy
 * LOD 	Limit Of Detection
 * MAC 	mass absorption coefficient
 * MAS 	Microbeam Analysis Society
 * MCA 	multichannel analyzer
 * MDM 	minimum detectable mass
 * MEEM 	Metastable Electron Emission Microscopy
 * MEM 	Mirror Electron Microscopy
 * MFM   Magnetic Force Microscopy
 * MLS 	multiple least squares fit
 * MMF 	minimum mass fraction
 * MS 	Mass Spectroscopy
 * MTXM  Magnetic Transmission X-ray Microscopy
 * NAA 	Neutron Activation Analysis
 * NIST 	National Institute of Standards and Technology
 * nm 	nanometer
 * NMR 	Nuclear Magnetic Resonance
 * NPD 	Nitrogen-Phosphorus Detector
 * OBHIC Optical Beam Heat Induced Current
 * OBIC 	Optical Beam Induced Current
 * OBIRCH Optical Beam Induced Resistance Change
 * OES 	Optical Emission Spectroscopy
 * P/B 	peak-to-background ratio
 * PAP 	Pouchou and Pichoir
 * PB 	phase boundary
 * PB 	Particle Beam
 * PEELS 	parallel electron energy-loss spectroscopy
 * PEEM 	Photoemission Electron Microscopy
 * PES 	Photoelectron Spectroscopy
 * PET 	Pentaerythritol
 * PLI 	Photoluminescence Imaging
 * PMT 	photomultiplier tube
 * PTMS  photothermal microspectroscopy
 * ppb 	parts per billion
 * ppm 	parts per million
 * QE 	quantum efficiency
 * RAP 	rubidum acid phthalate ratemeter
 * REM 	reflection electron microscope/microscopy
 * RESOXS Resonant Soft X-ray Scattering
 * RHEED 	reflection high-energy electron diffraction
 * S/N 	signal-to-noise ratio
 * SAD 	selected-area diffraction
 * SAED 	selected area electron diffraction
 * SAM 	scanning Auger microscopy/microprobe
 * SAXS 	Small-Angle X-ray Scattering
 * SCL 	Spectrally Resolved Cathodoluminescence
 * SE 	secondary electron
 * SEELS 	serial electron energy-loss spectrometer/spectrometry
 * SEM 	scanning electron microscope/microscopy
 * SESM 	scanning electron spectrometric spectroscopy
 * Si(Li) 	Lithium drifted silicon
 * SIMS 	secondary ion mass spectrometry/spectroscopy
 * SPEEM 	Scanning Photoemission Electron Microscopy
 * SPELEEM 	Spectroscopic Photoemission and Low Energy Electron Microscopy
 * SPEM 	Scanning Photoelectron Microscopy
 * SPM 	Scanning probe microscopy
 * SRM 	standard reference material
 * STEM 	scanning transmission electron microscope/microscopy
 * STM 	scanning tunneling microscope/microscopy
 * STS 	Scanning Tunneling Spectroscopy
 * STXM 	Scanning Transmission X-ray Microscopy
 * TAP 	Thallium Acid Phthalate
 * TB 	twin boundary
 * TED 	Transmission Electron Diffraction
 * TED 	Thermionic Emission Detector
 * TEM 	transmission electron microscope/microscopy
 * TIRF  Total internal reflection fluorescence microscope/microscopy
 * TLE 	Thin Layer Electrode
 * TOF-MS 	Time-Of-Flight Mass Spectrometry
 * TXM 	Transmission X-ray Microscopy
 * UHV 	ultrahigh vacuum
 * UTW 	ultra thin window
 * VDIC  voltage distribution contrast
 * VLM 	visible-light microscope/microscopy
 * WDS 	wavelength-dispersive
 * WDX 	wavelength dispersive X-ray spectroscopy
 * XANES 	X-ray absorption near-edge spectroscopy
 * XANES 	X-ray absorption near-edge structure
 * XEDS 	X-ray energy-dispersive
 * XPEEM 	X-ray Photoemission Electron Microscopy
 * XPLEEM 	X-ray Photoemission and Low Energy Electron Microscopy
 * XPS 	X-ray photoelectron spectroscopy
 * XRD 	X-ray diffraction
 * XRF 	X-ray Fluorescence
 * ZAF 	atomic number, absorption, fluorescence correction