Ion attachment mass spectrometry
You don't need to be Editor-In-Chief to add or edit content to WikiDoc. You can begin to add to or edit text on this WikiDoc page by clicking on the edit button at the top of this page. Next enter or edit the information that you would like to appear here. Once you are done editing, scroll down and click the Save page button at the bottom of the page.
Please Take Over This Page and Apply to be Editor-In-Chief for this topic: There can be one or more than one Editor-In-Chief. You may also apply to be an Associate Editor-In-Chief of one of the subtopics below. Please mail us [1] to indicate your interest in serving either as an Editor-In-Chief of the entire topic or as an Associate Editor-In-Chief for a subtopic. Please be sure to attach your CV and or biographical sketch.
| Infobox Laboratory equipment | |
| [[Image:|300px| ]] | |
| Data 1: | IAMS |
|---|---|
| Data 2: | |
| Data 3 (data hidden if data3 empty or not defined): | |
Ion-attachment mass spectrometry (IAMS) is a form of mass spectrometry that uses a "soft" form of ionization similar to chemical ionization in which a cation is attached to the analyte molecule in a reactive collision:
Where M is the analyte molecule, X+ is the cation and A is a non-reacting collision partner.[1]
Principle
This technique is applicable to gases or any materials that can be vaporized. It uses a non-fragmenting non-conventional ionisation mode, by attachment of a lithium (or alkaline) ion to the gas to be analysed with a more traditional mass filter. This instrument is more dedicated to analysis of moderately-sized molecules such as organic or aromatic compounds.[1]
Applications
Currently, it is used industrially to verify, with a high throughput, the concentrations of brominated flame retardants (BFR) in plastics in compliance with European RoHS (Restriction of Hazardous Substances) regulation in place since 2006. The banned molecules include PBB and PBDE, whose concentration should not exceed 0.1% w/w. [1][1][1]
IAMS has also been used to analyze diesel exhaust particles[1], in ceramic processing [1] and in semiconductor critical SiO2 etch processing.
References
Bibliography
- Y. Shiokawa; M. Nakamura; H. Maruyama; Y. Hirano; Y. Taneda; M. Inoue; T. Fujii (2004). "Development of ion attachment mass spectrometry and its applications" (in Japanese). Bunseki Kagaku 53 (6): 475-489. doi:10.2116/bunsekikagaku.53.475.
- M. Nakamura, K. Hino, T. Sasaki, Y. Shiokawa and T. Fujii. "In situ analysis of perfluoro compounds in semiconductor process exhaust: Use of Li+ ion-attachment mass spectrometry". doi:10.1116/1.1376704.
- Fujii T.; Selvin P.C.; Sablier M.; Iwase K.. "Lithium ion attachment mass spectrometry for on-line analysis of trace components in air: direct introduction". doi:10.1016/S1387-3806(01)00469-9.
- T. Ishiguro, A. Matsunami, K. Matsumoto, K. Kitagawa, N. Arai, A. K. Gupta. "Mass Spectrometric Detection of Ionic and Neutral Species During Highly Preheated Air Combustion by Alkali Element Ion Attachment". Journal of Engineering for Gas Turbines and Power. doi:10.1115/1.1473158.
External links
- What's About Ion Attachment Mass Spectrometry (IAMS). Ecole Polytechnique.
- RoHS official text
- US patent 7164121 Ion Attachment Mass Spectrometry Method
- US patent 7084397. Ion Attachment Mass Spectrometry Apparatusfr:Spectromètre de masse à attachement d'ions
Acknowledgement and Attribution Regarding Sources of Content
Some of the initial content on this page may be incorporated in part from copyleft sources in the public domain including wikis such as Wikipedia and AskDrWiki. Drug information for patients came from the The National Library of Medicine. Infectious disease information may have come from the Centers for Disease Control (CDC). Differential Diagnoses are drawn from clinicians as well as an amalgamation of 3 sources: 1.The Disease Database; 2. Kahan, Scott, Smith, Ellen G. In A Page: Signs and Symptoms. Malden, Massachusetts: Blackwell Publishing, 2004:3; 3. Sailer, Christian, Wasner, Susanne. Differential Diagnosis Pocket. Hermosa Beach, CA: Borm Bruckmeir Publishing LLC, 2002:7 .
